Rated current: 4 Amps
Product Description：Semiconductor test pins are also called "double-headed probes". Commonly used inner needle types include B, J, J1, U, U1, etc., which are small in size and require high testing accuracy. According to the structure, it is divided into: double-head-single-action probe, double-head-double-action probe series.
It is mainly used for extremely low contact resistance and ultra-high bandwidth in various communication power electronic components, semiconductor wafer testing, chip packaging testing, etc., which can meet the testing requirements of 5-40G high-frequency signals.
Currently, Xundeli can process small probe diameters: needle φ: 0.06mm/needle tube φ: 0.10mm.
Product name
SCFC068 series
Product parameters
Materials & Plated:
Barrel: Ph/SP, Au on Ni Plated
针头1(Plunger)：SK4/Becu，Au on Ni Plated；PD，No Plated
针头2(Plunger)：SK4/Becu，Au on Ni Plated；PD，No Plated
Spring: SWP/SUS, Au on Ni Plated
Electronic parameters (Electrical Spec.):
Current Rating: 4 Amps
Bandwidth: -1 dB@2.9 GHz
Inductace: 1.29 nH
Capacitance: 1.80 pF
Product introduction
Semiconductor test pins are also called "double-headed probes". Commonly used inner needle types include B, J, J1, U, U1, etc., which are small in size and require high testing accuracy. According to the structure, it is divided into: double-head-single-action probe, double-head-double-action probe series.
It is mainly used for extremely low contact resistance and ultra-high bandwidth in various communication power electronic components, semiconductor wafer testing, chip packaging testing, etc., which can meet the testing requirements of 5-40G high-frequency signals.
Currently, Xundeli can process small probe diameters: needle φ: 0.06mm/needle tube φ: 0.10mm.
Product categories
Installation method
Sample display
Application areas
We offer specialized POGO PIN solutions.Address：101, Block S, Block T, No. 1 Ruiji Road, Nanlian Community, Longgang Street, Longgang District, Shenzhen, China
Email：2737762634@qq.com
