Product name

SCFA031 series

Product parameters

Materials & Plated:

Barrel: Ph/SP, Au on Ni Plated

针头1(Plunger)：SK4/Becu，Au on Ni Plated；PD，No Plated

针头2(Plunger)：SK4/Becu，Au on Ni Plated；PD，No Plated

Spring: SWP/SUS, Au on Ni Plated

Electronic parameters (Electrical Spec.):

Current Rating: 3 Amps 

Bandwidth: -1 dB@27.9 GHz

Inductace: 1.17 nH

Capacitance: 1.46 pF

Product introduction

Semiconductor test pins are also called "double-headed probes". Commonly used inner needle types include B, J, J1, U, U1, etc., which are small in size and require high testing accuracy. According to the structure, it is divided into: double-head-single-action probe series, double-head-double-action probe series. 

It is mainly used for extremely low contact resistance and ultra-high bandwidth in various communication power electronic components, semiconductor wafer testing, chip packaging testing and other links, which can meet the testing requirements of 5-40G high-frequency signals.    

Currently, Xundeli can process small probe diameters: needle φ: 0.06mm/needle tube φ: 0.10mm. 

Product categories

Installation method

Sample display

Application areas