Author:Release time:2024-11-06 49 subview
Mainly used for semiconductor wafer testing, chip package testing. Extremely low contact resistance. Ultra-high bandwidth, can meet the 5-40GHZ RF requirements of the test probe.
Address:101, Block S, Block T, No. 1 Ruiji Road, Nanlian Community, Longgang Street, Longgang District, Shenzhen, China
Email:2737762634@qq.com

